The equipment is semiconductor
aging testing equipment to full-automatically execute
burn-in processing and data measurement/judgment/analytical
processing and also has tester function as well as temperature
accelerating testing.
Features
Ultra-precise measuring
techniques to detect variation of 10-12
ampere
A total system from
temperature control to data processing
Completed automatic
system by using up-dated computer techniques
A full line up covering
from laboratory uses to on-line production
Functions
Testing part
Exclusive test fixtures
corresponding to various devices are prepared, and
various testing baths are prepared corresponding to
lot sizes and point number.
Temperature monitoring
of testing bath
Temperature pattern control
and stability monitoring interlocking to testing modes
are executed.
Measuring control processing
Bias applied and voltage/current/light
output to device are accurately executed and measured
values are transferred to a personal computer.
Data processing
Interactive settings for
aging testing are executed through a personal computer
and sensitivity is automatically adjusted by a personal
computer. In addition, measured values are stored
into a disk and analytical data can be shown on a
CRT as figure or table format and outputted.
Host computer communications
Enormous quantity of data
got from again processing are transferred to a host
computer, and storage. Management and high grade of
analytical processing can be executed.
Applications
Opto-electronics
devise
Laser
diode (short wave, long wave)
Photo diode
Opto-semiconductor module
Light emitting diode
LED dot display
EL display device
Electronic
parts
Zener
diode
Tantalum capacitor
Mylar capacitor
IC card
VLSI
Transistor
MOS/FET
High frequency transistor
Thermistor
Peltier element
Switching element
Superconductivity element
Hole element
