The equipment is semiconductor aging testing equipment to full-automatically execute burn-in processing and data measurement/judgment/analytical processing and also has tester function as well as temperature accelerating testing.
- Ultra-precise measuring techniques to detect variation of 10-12 ampere
- A total system from temperature control to data processing
- Completed automatic system by using up-dated computer techniques
- A full line up covering from laboratory uses to on-line production
♦ Testing partExclusive test fixtures corresponding to various devices are prepared, and various testing baths are prepared corresponding to lot sizes and point number.
♦ Temperature monitoring of testing bathTemperature pattern control and stability monitoring interlocking to testing modes are executed.
♦ Measuring control processingBias applied and voltage/current/light output to device are accurately executed and measured values are transferred to a personal computer.
♦ Data processingInteractive settings for aging testing are executed through a personal computer and sensitivity is automatically adjusted by a personal computer. In addition, measured values are stored into a disk and analytical data can be shown on a CRT as figure or table format and outputted.
♦ Host computer communications
Enormous quantity of data
got from again processing are transferred to a host
computer, and storage. Management and high grade of
analytical processing can be executed.
diode (short wave, long wave)
Light emitting diode
LED dot display
EL display device
High frequency transistor
for the universe